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Browsing by Author Rao, V. Ramgopal

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Issue DateTitleAuthor(s)
2015Source/drain engineering in OFETs using self assembled monolayers of metal complexed porphyrinsRao, V. Ramgopal
2018A spectroscopy and microscopy study of Parylene-C OFETs for explosive sensingRao, V. Ramgopal
2015Spin-coatable, photopatternable magnetic nanocomposite thin films for MEMS device applicationsRao, V. Ramgopal
2021-02Stand-by Power Reduction Using Experimentally Demonstrated Nano-Electromechanical Switch in CMOS TechnologiesRao, V. Ramgopal
2002Status and Trends in Molecular ElectronicsRao, V. Ramgopal
2022-08Strain induced anisotropic effect on electron mobility in C60 based organic field effect transistorsRao, V. Ramgopal
1999-09A study of 100 nm channel length asymmetric channel MOSFET by using charge pumpingRao, V. Ramgopal
2001-09Study of Degradation in Channel Initiated Secondary Electron Injection RegimeRao, V. Ramgopal
2022Study of Gold nanoparticles binding dynamics on functionalized surface by ATR-evanescent wave absorption methodRao, V. Ramgopal
2001-10A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping techniqueRao, V. Ramgopal
2020-01A study of surface stress and flexural rigidity of symmetrically and asymmetrically biofunctionalized microcantileversRao, V. Ramgopal
1998-09A Study of the Effect of Plasma Etch Damage on Sub-Micron MOSFET's Flicker Noise PropertiesRao, V. Ramgopal
2013-08Sub 0.5V Operation of Performance Driven Mobile Systems Based on Area Scaled Tunnel FET DevicesRao, V. Ramgopal
1998-10Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technologyRao, V. Ramgopal
2001-07Sub-100 nm CMOS circuit performance with high-K gate dielectricsRao, V. Ramgopal
2008Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?Rao, V. Ramgopal
2020-09Sub-50-mV Nanoelectromechanical Switch Without Body BiasRao, V. Ramgopal
2004-07Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS MemoriesRao, V. Ramgopal
2005-03Superior hot carrier reliability of single halo (SH) silicon-on-insulator (SOI) nMOSFET in analog applicationsRao, V. Ramgopal
2002Suppression of boron penetration by hot wire CVD polysiliconRao, V. Ramgopal