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Browsing by Author Rao, V. Ramgopal

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Issue DateTitleAuthor(s)
2009-03Determining ionizing radiation using sensors based on organic semiconducting materialRao, V. Ramgopal
2020-02Development of a new polymer (OSTE+) optical waveguide for evanescent wave absorption-based photonic sensorsRao, V. Ramgopal
2014Development of graphene nanoplatelet embedded polymer microcantilever for vapour phase explosive detection applicationsRao, V. Ramgopal
2003Device and circuit performance issues with deeply scaled high-K MOS transistorsRao, V. Ramgopal
2008-02Device Design and Optimization Considerations for Bulk FinFETsRao, V. Ramgopal
2000-04Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETsRao, V. Ramgopal
2011-02Device Scaling Effects on Substrate Enhanced Degradation in MOS TransistorsRao, V. Ramgopal
2016Device-circuit co-design for high performance level shifter by limiting quasi-saturation effects in advanced DeMOS transistorsRao, V. Ramgopal
1999-05A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETsRao, V. Ramgopal
2008DNA Based NanoelectronicsRao, V. Ramgopal
2000-09Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage RegimeRao, V. Ramgopal
2009-09Drain current model for nanoscale double-gate MOSFETsRao, V. Ramgopal
2007Drain current model for undoped symmetric double-gate FETs using a velocity saturation model with exponent n=2Rao, V. Ramgopal
2008-08Drain Current Model Including Velocity Saturation for Symmetric Double-Gate MOSFETsRao, V. Ramgopal
2015-02Drain extended MOS device design for integrated RF PA in 28nm CMOS with optimized FoM and ESD robustnessRao, V. Ramgopal
2020-02E-Nose: Multichannel Analog Signal Conditioning Circuit With Pattern Recognition for Explosive SensingRao, V. Ramgopal
2012-07Effect of Central Metal Ion on Molecular Dipole in Porphyrin Self-Assembled MonolayersRao, V. Ramgopal
2020-07Effect of Device Dimensions, Layout and Pre-Gate Carbon Implant on Hot Carrier Induced Degradation in HKMG nMOS TransistorsRao, V. Ramgopal
2001Effect of Fringing Capacitances in Sub 100 nm MOSFET's with High-K Gate DielectricsRao, V. Ramgopal
2002-05The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performanceRao, V. Ramgopal