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Browsing by Author Rao, V. Ramgopal

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Issue DateTitleAuthor(s)
2009DC & transient circuit simulation methodologies for organic electronicsRao, V. Ramgopal
2012-10DC Compact Model for SOI Tunnel Field-Effect TransistorsRao, V. Ramgopal
2005Deep sub-micron device and analog circuit parameter sensitivity to process variations with halo doping and its effect on circult linearityRao, V. Ramgopal
2011-02Degradation Study of Ultra-Thin JVD Silicon Nitride MNSFETRao, V. Ramgopal
2006-12Design and Fabrication Issues in Affinity Cantilevers for bioMEMS ApplicationsRao, V. Ramgopal
2015-12Design of Well Doping Profile for Improved Breakdown and Mixed-Signal Performance of STI-Type DePMOS DeviceRao, V. Ramgopal
2003-01Detailed analysis of FIBL in MOS transistors with high-k gate dielectricsRao, V. Ramgopal
2021Detection of the Chilli Leaf Curl Virus Using an Attenuated Total Reflection-Mediated Localized Surface-Plasmon-Resonance-Based Optical PlatformRao, V. Ramgopal
2022-12Detection of tomato leaf curl New Delhi virus DNA using U-bent optical fiber-based LSPR probesRao, V. Ramgopal
2009-03Determining ionizing radiation using sensors based on organic semiconducting materialRao, V. Ramgopal
2020-02Development of a new polymer (OSTE+) optical waveguide for evanescent wave absorption-based photonic sensorsRao, V. Ramgopal
2014Development of graphene nanoplatelet embedded polymer microcantilever for vapour phase explosive detection applicationsRao, V. Ramgopal
2003Device and circuit performance issues with deeply scaled high-K MOS transistorsRao, V. Ramgopal
2008-02Device Design and Optimization Considerations for Bulk FinFETsRao, V. Ramgopal
2000-04Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETsRao, V. Ramgopal
2011-02Device Scaling Effects on Substrate Enhanced Degradation in MOS TransistorsRao, V. Ramgopal
2016Device-circuit co-design for high performance level shifter by limiting quasi-saturation effects in advanced DeMOS transistorsRao, V. Ramgopal
1999-05A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETsRao, V. Ramgopal
2008DNA Based NanoelectronicsRao, V. Ramgopal
2000-09Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage RegimeRao, V. Ramgopal