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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/10072
Title: A Cybertwin-Based 6G Cooperative IoE Communication Network: Secrecy Outage Analysis
Authors: Joshi, Sandeep
Keywords: EEE
Cybertwin
Internet of Everything (IoE)
Nonorthogonal-multiple-access (NOMA)
Secrecy outage probability
Sixth-generation (6G)
Issue Date: Jul-2022
Publisher: IEEE
Abstract: The sixth-generation (6G) communication networks being highly data-intensive and enabled by the Internet of Everything (IoE) are envisaged to find applications in various domains including smart healthcare, smart industry, and gaming. In this article, a novel hybrid 6G-based cybertwin cooperative architecture is studied and an analytical framework for the secrecy outage analysis is presented. The base station (BS) considered utilizes nonorthogonal-multiple-access for content request transmission to the cybertwin host and the server with a direct communication link present between the BS and the server. A wireless link experiencing Nakagami- m fading is considered which is further assisted in the communication network by a wired link which is a power line communication link and experiences Rayleigh fading, for the communication between the cybertwin host and the server. Secrecy error probability expressions are derived for the cybertwin host and the server for the scenario when both the wireless and the wired links are available for communication and only the wireless link is available for communication. Furthermore, the presented analytical results are corroborated with simulation results which demonstrate the optimality of operating the wireless links at lower signal-to-noise ratio (SNR) values. It is observed that for the lower values of Nakagami fading parameter, better secrecy performance is observed with the usage of wired link along with the wireless link, and also the secrecy performance of the cybertwin host and the server is dependent on the system parameters like the fading parameter and the average SNR.
URI: https://ieeexplore.ieee.org/document/9669056
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10072
Appears in Collections:Department of Electrical and Electronics Engineering

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