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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/10155
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dc.contributor.authorKumar, Rahul-
dc.date.accessioned2023-04-03T10:44:05Z-
dc.date.available2023-04-03T10:44:05Z-
dc.date.issued2014-
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/6808083-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10155-
dc.description.abstractChange of linearity and gain with different drain and gate bias has been studied for AlGaN/GaN HEMT on Sapphire substrate. While linearity increases with higher drain bias, maximum gain of the device decreases. Generation of more phonon and its related scattering of electrons decrease the mobility of carries. It further minimizes the drain current at high longitudinal field on 2DEG channel.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectHigh-electron-mobility transistor (HEMT)en_US
dc.subjectAlGaN/GaN Sapphireen_US
dc.subjectLinearityen_US
dc.subjectGainen_US
dc.titleEffect of Longitudinal Electric Field and Self Heating of Channel on Linearity and Gain of AlGaN/GaN HEMT on Sapphire (0001)en_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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