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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/10160
Title: Colloidal lithography nanostructured Pd/PdOx core–shell sensor for ppb level H2S detection
Authors: Benedict, Samatha
Keywords: EEE
Lithography nanostructured
Pd/PdOx core–shell sensor
H2S detection
Issue Date: Apr-2018
Publisher: IOP
Abstract: In this work we report on plasma oxidation of palladium (Pd) to form reliable palladium/palladium oxide (Pd/PdOx) core–shell sensor for ppb level H2S detection and its performance improvement through nanostructuring using hole-mask colloidal lithography (HCL). The plasma oxidation parameters and the sensor operating conditions are optimized to arrive at a sensor device with high sensitivity and repeatable response for H2S. The plasma oxidized palladium/palladium oxide sensor shows a response of 43.1% at 3 ppm H2S at the optimum operating temperature of 200 °C with response and recovery times of 24 s and 155 s, respectively. The limit of detection (LoD) of the plasma oxidised beam is 10 ppb. We further integrate HCL, a bottom-up and cost-effective process, to create nanodiscs of fixed diameter of 100 nm and varying heights (10, 15 and 20 nm) on 10 nm thin Pd beam which is subsequently plasma oxidized to improve the H2S sensing characteristics. The nanostructured Pd/PdOx sensor with nanodiscs of 100 nm diameter and 10 nm height shows an enhancement in sensing performance by 11.8% at same operating temperature and gas concentration. This nanostructured sensor also shows faster response and recovery times (15 s and 100 s, respectively) compared to the unstructured Pd/PdOx counterpart together with an experimental LoD of 10 ppb and the estimated limit going all the way down to 2 ppb. Material characterization of the fabricated Pd/PdOx sensors is done using UV–vis spectroscopy and x-ray photoemission spectroscopy.
URI: https://iopscience.iop.org/article/10.1088/1361-6528/aaba88
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10160
Appears in Collections:Department of Electrical and Electronics Engineering

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