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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/10213
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dc.contributor.authorVidhyadharan, Sanjay-
dc.date.accessioned2023-04-06T09:25:05Z-
dc.date.available2023-04-06T09:25:05Z-
dc.date.issued2021-03-
dc.identifier.urihttps://www.emerald.com/insight/content/doi/10.1108/WJE-08-2020-0367/full/html-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10213-
dc.description.abstractTunnel field effect transistors (TFETs) have significantly steeper sub-threshold slope (24–30 mv/decade), as compared with the conventional metal–oxide–semiconductor field-effect transistors (MOSFETs), which have a sub-threshold slope of 60 mv/decade at room temperature. The steep sub-threshold slope of TFETs enables a much faster switching, making TFETs a better option than MOSFETs for low-voltage VLSI applications. The purpose of this paper is to present a novel hetero-junction TFET-based Schmitt triggers, which outperform the conventional complementary metal oxide semiconductor (CMOS) Schmitt triggers at low power supply voltage levels.en_US
dc.language.isoenen_US
dc.publisherEmeralden_US
dc.subjectEEEen_US
dc.subjectVLSI applicationsen_US
dc.subjectTFET-based Schmitten_US
dc.titleImproved hetero-junction TFET-based Schmitt trigger designs for ultra-low-voltage VLSI applicationsen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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