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dc.contributor.authorRao, V. Ramgopal-
dc.date.accessioned2023-10-26T10:01:29Z-
dc.date.available2023-10-26T10:01:29Z-
dc.date.issued2022-08-
dc.identifier.urihttps://pubs.aip.org/aip/apl/article/101/8/083305/111989/Strain-induced-anisotropic-effect-on-electron-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12645-
dc.description.abstractThe electron mobility was found to increase (decrease) upon applied compressive (tensile) strain, respectively, when a high-performance flexible C60-based organic field-effect transistor (OFET) was subjected to different bending radii. The observed almost twofold relative change in the electron mobility is considerably larger than that reported before for pentacene-based OFETs. Moreover, the strain dependency of electron mobility in C60 films is strongly anisotropic with respect to the strain direction measured relative to the current flow. Analysis within a hopping-transport model for OFET mobility suggests that the observed strain dependency on electron transport is dominated mostly by the change of inter-grain coupling in polycrystalline C60 films.en_US
dc.language.isoenen_US
dc.publisherAIPen_US
dc.subjectEEEen_US
dc.subjectElectron mobilityen_US
dc.subjectAnisotropic Motionen_US
dc.titleStrain induced anisotropic effect on electron mobility in C60 based organic field effect transistorsen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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