Current Excitation Method for ΔR Measurement in Piezo-Resistive Sensors With a 0.3-ppm Resolution

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DC Field	Value	Language
dc.contributor.author	Rao, V. Ramgopal	-
dc.date.accessioned	2023-10-27T06:46:52Z	-
dc.date.available	2023-10-27T06:46:52Z	-
dc.date.issued	2012-03	-
dc.identifier.uri	https://ieeexplore.ieee.org/document/6086761	-
dc.identifier.uri	http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12663	-
dc.description.abstract	This paper presents a new highly sensitive (10 μV/ppm) bidirectional current excitation method for piezo-resistive sensor measurements, through excitation of two half bridges for Δ R measurement. The proposed circuit is insensitive to thermoelectric and stray noise effects since it measures the peak-to-peak value of the generated voltage. Measurement results using resistors show that variations as low as 0.3 ppm are measurable from 15°C to 80°C with resistors. As an experimental application, 40 parts per billion variation in gas concentration using piezo-resistive SU-8 microcantilevers is measured by the proposed circuit at room temperature.	en_US
dc.language.iso	en	en_US
dc.publisher	IEEE	en_US
dc.subject	EEE	en_US
dc.subject	Bidirectional current source	en_US
dc.subject	Cantilevers	en_US
dc.subject	Current excitation	en_US
dc.subject	Piezo resistivity	en_US
dc.subject	Wheatstone's bridge	en_US
dc.title	Current Excitation Method for ΔR Measurement in Piezo-Resistive Sensors With a 0.3-ppm Resolution	en_US
dc.type	Article	en_US
Appears in Collections:	Department of Electrical and Electronics Engineering

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