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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/12696
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dc.contributor.authorRao, V. Ramgopal-
dc.date.accessioned2023-10-28T04:32:30Z-
dc.date.available2023-10-28T04:32:30Z-
dc.date.issued2009-
dc.identifier.urihttps://www.tandfonline.com/doi/abs/10.1080/15533170903094964-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12696-
dc.description.abstractHigh dielectric oxides namely ZrO2 and HfO2 have gained a lot of importance as they are candidates in the electronic industry in the form of CMOS technology. A complete review of the literature examples of the precursors employed in the deposition of the thin films of these metal oxides, followed by methodology to design precursors with desirable physicochemical properties have been described in this review article.en_US
dc.language.isoenen_US
dc.publisherTaylor & Francisen_US
dc.subjectEEEen_US
dc.subjectCVD precursorsen_US
dc.subjectHafniaen_US
dc.subjectHigh dialectric oxidesen_US
dc.subjectOxide precursorsen_US
dc.subjectZirconiaen_US
dc.titleChemical Vapor Deposition Precursors for High Dielectric Oxides: Zirconium and Hafnium Oxideen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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