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dc.contributor.authorSingh, Navin-
dc.date.accessioned2024-02-20T04:16:01Z-
dc.date.available2024-02-20T04:16:01Z-
dc.date.issued2001-09-
dc.identifier.urihttps://journals.aps.org/pre/abstract/10.1103/PhysRevE.64.042901-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14350-
dc.description.abstractEffect of defects on the melting profile of short heterogeneous DNA chains is calculated using the Peyrard-Bishop Hamiltonian. On-site potential on a defect site is represented by a potential that has only a short-range repulsion and a flat part without well of the Morse potential. Stacking energy between two neigbouring pairs involving a defect site is also modified. The results are found to be in good agreement with the experiments.en_US
dc.language.isoenen_US
dc.publisherAPSen_US
dc.subjectPhysicsen_US
dc.subjectDNA oligomersen_US
dc.titleEffect of defects on thermal denaturation of DNA oligomersen_US
dc.typeArticleen_US
Appears in Collections:Department of Physics

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