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dc.contributor.authorGangopadhyay, Subhashis-
dc.date.accessioned2024-03-06T09:42:03Z-
dc.date.available2024-03-06T09:42:03Z-
dc.date.issued2010-09-
dc.identifier.urihttps://pubs.aip.org/aip/jap/article/108/5/053510/345667/Microstructural-characteristics-and-phonon-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14546-
dc.description.abstractGe nanocrystals embedded in matrices were prepared by rf magnetron sputtering technique. Transmission electron micrographs reveal the formation of spherical shape Ge nanocrystals of 4–6 nm diameters for and 6–9 nm for annealed samples. X-ray photoelectron spectroscopy confirms the formation of surface oxidized Ge nanocrystals. Embedded Ge nanocrystals show strong photoluminescence peaks in visible and ultraviolet region even at room temperature. Spectral analysis suggests that emission in 1.58 and 3.18 eV bands originate from ⁠, and optical transitions in GeO color centers, respectively, and those in the range 2.0–3.0 eV are related to Ge/O defects at the interface of the oxidized nanocrystals. Temperature dependent photoluminescence study has revealed additional fine structures with lowering of temperature, the origin of which is attributed to the strong coupling of electronic excitations with local vibration of germanium oxides at the surface.en_US
dc.language.isoenen_US
dc.publisherAIPen_US
dc.subjectPhysicsen_US
dc.subjectExcitonsen_US
dc.subjectPhononsen_US
dc.subjectNanocrystalsen_US
dc.subjectTransmission electron microscopyen_US
dc.subjectX-ray photoelectron spectroscopy (XPS)en_US
dc.titleMicrostructural characteristics and phonon structures in luminescence from surface oxidized Ge nanocrystals embedded in matrixen_US
dc.typeArticleen_US
Appears in Collections:Department of Physics

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