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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/14608
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dc.contributor.authorNair, Sindhu S.-
dc.date.accessioned2024-04-22T09:09:52Z-
dc.date.available2024-04-22T09:09:52Z-
dc.date.issued2004-09-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0039602804007496-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14608-
dc.description.abstractUsing Auger electron spectroscopy we have studied the growth of cobalt oxide on Ag(1 0 0) substrate at different substrate temperatures (25, 170 and 250 °C). The films grown at 170 °C substrate temperature were found to grow closest to a layer-by-layer growth mode. In order to experimentally investigate the electronic structure of the CoO films angle-resolved UV photoelectron spectra were recorded for a 10 ML CoO film that are discussed and compared with available experimental results.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectPhysicsen_US
dc.subjectCobalt oxidesen_US
dc.subjectAngle resolved photoemissionen_US
dc.subjectSurface Electronic Phenomenaen_US
dc.titleGrowth mechanism and angle-resolved photoemission spectra of cobalt oxide (CoO) thin films on Ag(1 0 0)en_US
dc.typeArticleen_US
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