DSpace logo

Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14810
Full metadata record
DC FieldValueLanguage
dc.contributor.authorRano, Dinesh-
dc.date.accessioned2024-05-10T10:12:36Z-
dc.date.available2024-05-10T10:12:36Z-
dc.date.issued2022-
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/9768886-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14810-
dc.description.abstractThis paper reports the conceptualization, and analysis of a geometrical approach to determine the shift in the in-phase reflection of three conformal meta-surfaces (MS). For the proposed approach, a planar array consisting of MS unit cells (MS-UCs) of a given dimension is drawn on a circle of desired radius (r). The path traveled by the reflected and incident EM wave in terms of an electrical length results in the shift of reflection angle. For the validation purpose, the conformed arrays are simulated under x- and y-polarized EM waves. The sum of the incident and reflected phases resulting in total shift is determined theoretically and compared with the simulated shifts of the three arrays. Furthermore, one of the conformed arrays is experimentally evaluated under the TEM incidence and compared with the theoretical and simulated result. The excellent agreement between the theoretical and measured results demonstrates the effectiveness of the proposed work.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectAntennaen_US
dc.subjectReflection Phaseen_US
dc.subjectPerfect Electric Conductoren_US
dc.subjectElectromagnetic Band-Gap Surface (EBG)en_US
dc.titleAnalysis of Normally Incident EM Waves Reflected from a Conformal Meta-surfaceen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.