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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16591
Title: Investigation of a highly-sensitive aluminum-based plasmonic device using antimonene for sensing applications
Authors: Arora, Pankaj
Keywords: EEE
CMOS technology
Surface plasmon resonance (SPR)
Black Phosphorus
Issue Date: Jan-2024
Publisher: IOP
Abstract: Aluminum (Al) has gained popularity for surface plasmon resonance-based applications due to its affordability and compatibility with CMOS technology at the nanoscale. Over angle-interrogation mode, plasmonic interactions occurring at the metal-dielectric junction, are the outcomes of the attenuated total internal reflection phenomenon. Modified Al-based Kretschmann configuration results in phase-matching conditions that are seen as resonant points in the reflection characteristics. In our work, we have engineered an Al-based plasmonic device utilizing Antimonene as a 2D nanomaterial for bio-sensing purposes in the Near-Infrared (NIR) spectral domain. The study investigates the performance of Surface Plasmon Resonance (SPR) based refractive index sensor using different 2D nanomaterials with an optimized Al thickness of 30 nm. A comparative analysis of Al-based Kretschmann configurations in the presence of Graphene, Black Phosphorus, MXene, and Antimonene is presented using engineered intermediate layers. It is observed that the Al-antimonene-based plasmonic device exhibits improved sensing parameters in the NIR optical window.
URI: https://iopscience.iop.org/article/10.1088/1402-4896/ad1f1d
http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16591
Appears in Collections:Department of Electrical and Electronics Engineering

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