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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16622
Title: Theoretical Investigation of Thickness Variation on Ga2O3 MESFET: Depletion to Enhancement Mode Transition
Authors: Kumar, Rahul
Keywords: EEE
MESFET
Gallium oxide (Ga2O3)
Depletion mode
Enhancement mode
Schottky
Issue Date: 2023
Publisher: IEEE
Abstract: We have investigated the DC characteristics of Ga 2 O 3 -based metal semiconductor field effect transistor (MESFET). Different channel thicknesses namely 1000 nm, 500 nm, 250 nm and 100 nm have been employed for simulation. By reducing the channel thickness, depletion mode (D-mode) devices turned into enhancement mode (E-mode) devices. Peculiar exponential output characteristics have been observed in the subthreshold region.
URI: https://ieeexplore.ieee.org/abstract/document/10127322
http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16622
Appears in Collections:Department of Electrical and Electronics Engineering

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