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dc.contributor.authorZafaruddin, S.M.
dc.date.accessioned2025-01-02T04:46:34Z
dc.date.available2025-01-02T04:46:34Z
dc.date.issued2023-12
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/10464642
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16671
dc.description.abstractThe α−η−κ−μ is one of the most generalized and flexible channel models having an excellent fit to experimental data from diverse propagation environments. The existing statistical results on the envelope of α−η−κ−μ model contain an infinite series, prohibiting its widespread application in the performance analysis of wireless systems. This paper employs a novel approach to derive density and distribution functions of the envelope of the α−η−κ−μ fading channel without an infinite series approximation. The derived statistical results are presented using a single Fox's H-function for tractable performance analysis, especially for high-frequency mmWave and terahertz wireless transmissions. We also develop an asymptotic analysis using the Gamma function, which converges to the exact values within a reasonable range of channel parameters. To further substantiate the proposed analysis, we present the exact outage probability and average bit-error-rate (BER) performance of a wireless link subjected to the α−η−κ−μ fading model using a single trivariate Fox's H-function. We obtain the diversity order of the system by analyzing the outage probability at a high signal-to-noise (SNR) ratio. We use simulations to demonstrate the significance of the developed statistical results compared with the existing infinite series representation of the α−η−κ−μ model.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subject$\alpha-\eta-\kappa-\mu$en_US
dc.subjectFading channelsen_US
dc.subjectFox's H-functionen_US
dc.subjectSmall-scale fadingen_US
dc.subjectmmWaveen_US
dc.subjectTerahertzen_US
dc.titleAn Exact Statistical Representation of α−η−κ−μ Fading Model for THz Wireless Communicationen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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