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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16738
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dc.contributor.authorMishra, Neeraj-
dc.date.accessioned2025-01-08T04:31:38Z-
dc.date.available2025-01-08T04:31:38Z-
dc.date.issued2023-07-
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/10192158-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16738-
dc.description.abstractThis article proposes a method for performing device-level variability-aware static timing analysis (STA) on digital circuits using a tool flow methodology based on Python and Bash scripting. The method involves creating an effective current source model (ECSM) .libs file with a custom tool flow, which incorporates variation-aware timing models of standard cells to minimize recharacterization efforts. The resulting file is integrated into an industry-standard STA tool environment to assess the impact of device and layout level variability on digital timing closure. The simulation work is carried out using Mentor Graphics ELDO SPICE, Synopsys DC Compiler, and PrimeTime STA environment in STMicroelectronics (STM) 65 nm CMOS process. This tool flow reduces recharacterization efforts by 98.13% compared to conventional SPICE simulation by incorporating the impact of device-level variability on the conventional STA flow.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectEffective current source model (ECSM)en_US
dc.subjectPython plotting toolen_US
dc.subjectVariability-aware STAen_US
dc.subjectSemiconductor device modelingen_US
dc.titleBeyond SPICE Simulation: A Novel Variability-Aware STA Methodology for Digital Timing Closureen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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