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DC Field | Value | Language |
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dc.contributor.author | Bodys, J. W. S. | - |
dc.contributor.author | Campbell, Kenneth C. | - |
dc.date.accessioned | 2025-02-19T11:27:53Z | - |
dc.date.available | 2025-02-19T11:27:53Z | - |
dc.date.issued | 1974 | - |
dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/17904 | - |
dc.description.abstract | Nickel films have been evaporated in the presence of krypton on to a Pyrex substrate maintained at 77 K, and the variation of the krypton incorporation with metal deposition rate and krypton pressure has been studied. Deposition rates were varied between 13 µg and 4.42 mg min–1 and krypton pressures between 3 × 10–3 and 1.3 Torr (0.4 and 173 N m–2). Krypton uptakes of up to almost 6 atom % have been observed. The results are interpreted in terms of a model based on the concept of cryotrapping. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Journal of the Chemical Society : Faraday Transaction - I. The Chemical Society, London. 1974, 70 (12) | en_US |
dc.subject | Chemistry | en_US |
dc.subject | Kryptonation | en_US |
dc.subject | Film Evaporation | en_US |
dc.subject | Journal of the Chemical Society : Faraday Transaction - I | en_US |
dc.title | Mechanism of the Kryptonation of Nickel by Film Evaporation | en_US |
dc.type | Article | en_US |
Appears in Collections: | Journal Articles (before-1995) |
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2170-2179.pdf Restricted Access | 751.84 kB | Adobe PDF | View/Open Request a copy |
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