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Results 1-10 of 17 (Search time: 0.002 seconds).
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Issue Date
Title
Author(s)
2010
NEXT Evolution of Hierarchical Hexagonal Stacked Plates of CuS from Liquid−Liquid Interface and its Photocatalytic Application for Oxidative Degradation of Different Dyes under Indoor Lighting
Basu, Mrinmoyee
2022-06
Deep Learning Enhanced UAV Imagery for Critical Infrastructure Protection
Chamola, Vinay
1996-05
Effect of environmentally degraded soil on crop yield: The role of conservation, Ecol. Model., 86: 235-240, 1996.
Dubey, Balram
2023-04
Degradation Estimation of Polymer Electrolyte Fuel Cell under Different Cycling Load Profiles
Verma, Saket
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2001-09
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
1997-03
High-field stressing of LPCVD gate oxides
Rao, V. Ramgopal
2005
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]
Rao, V. Ramgopal
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Author
13
Rao, V. Ramgopal
1
Basu, Mrinmoyee
1
Chamola, Vinay
1
Dubey, Balram
1
Verma, Saket
Subject
14
EEE
5
MOSFETs
4
Threshold voltage
3
MOSFET circuits
3
Nonvolatile memory
3
Voltage
2
Capacitance
2
Charge measurement
2
Current measurement
2
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Date issued
2
2020 - 2023
1
2010 - 2019
9
2000 - 2009
5
1996 - 1999
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17
false