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Issue Date
Title
Author(s)
2000-01
A Comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
2003
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
1997-12
Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs
Rao, V. Ramgopal
2002-06
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
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Author
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Rao, V. Ramgopal
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EEE
7
MOSFETs
2
Degradation
2
Transconductance
1
Charge pumping
1
CMOS technology
1
Current measurement
1
Doping profiles
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Fabrication
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2000
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