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Issue Date
Title
Author(s)
2002-06
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
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Author
3
Rao, V. Ramgopal
Subject
1
Charge measurement
1
Circuit simulation
1
Degradation
1
Hot carriers
1
Ion implantation
1
Look-up table (LUT)
1
Non-quasi-static model
1
Pulse measurements
1
Semiconductor device doping
1
Semiconductor device reliability
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