Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Faculty Publications
Department of Electrical and Electronics Engineering
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 31-37 of 37 (Search time: 0.002 seconds).
previous
1
2
3
4
next
Item hits:
Issue Date
Title
Author(s)
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
2009
The Electrochemical Society, find out more Analysis of Threshold Voltage Variations of FinFETs Relating to Short Channel Effects
Rao, V. Ramgopal
2004
The influence of process variations on the Halo MOSFETs and its implications on the analog circuit performance
Rao, V. Ramgopal
2004
Understanding the Impact of Process Variations on Analog Circuit Performance with Halo Channel Doped Deep Sub-Micron CMOS Technologies
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
Discover
Author
37
Rao, V. Ramgopal
Subject
5
Hot carriers
5
Los Angeles Council
3
Charge pumping
3
Circuit simulation
3
Current measurement
3
Degradation
3
FinFETs
3
Medical simulation
3
Semiconductor device doping
3
Silicon
.
next >
Date issued
8
2001
6
2003
6
2009
3
2000
3
2002
3
2004
3
2005
3
2008
1
2006
1
2007
.
next >