Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Faculty Publications
Department of Electrical and Electronics Engineering
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 1-3 of 3 (Search time: 0.001 seconds).
previous
1
next
Item hits:
Issue Date
Title
Author(s)
2020-07
Effect of Device Dimensions, Layout and Pre-Gate Carbon Implant on Hot Carrier Induced Degradation in HKMG nMOS Transistors
Rao, V. Ramgopal
2017-08
PBTI in HKMG nMOS Transistors— Effect of Width, Layout, and Other Technological Parameters
Rao, V. Ramgopal
2016
Width and layout dependence of HC and PBTI induced degradation in HKMG nMOS transistors
Rao, V. Ramgopal
Discover
Author
3
Rao, V. Ramgopal
Subject
3
EEE
2
Device scaling
2
Gate current
2
Positive bias temperature instabi...
2
Threshold voltage
1
Charge trapping
1
Dipole
1
High-K dielectric
1
Lanthanum (La) capping layer
1
Metal gates
.
next >
Date issued
1
2016
1
2017
1
2020
Has File(s)
3
false