Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Faculty Publications
Department of Electrical and Electronics Engineering
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 1-5 of 5 (Search time: 0.002 seconds).
previous
1
next
Item hits:
Issue Date
Title
Author(s)
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2007-08
Border-Trap Characterization in High-κ Strained-Si MOSFETs
Rao, V. Ramgopal
2001-04
Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs
Rao, V. Ramgopal
2001-10
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
1999-09
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
Rao, V. Ramgopal
Discover
Author
5
Rao, V. Ramgopal
Subject
5
EEE
4
MOSFETs
1
1/f noise
1
Border traps
1
Current measurement
1
Degradation
1
Hot carriers
1
Hot-carrier effect
1
Hysteresis
1
Interface trapping
.
next >
Date issued
3
2001
1
1999
1
2007
Has File(s)
5
false