Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Faculty Publications
Department of Electrical and Electronics Engineering
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 1-2 of 2 (Search time: 0.002 seconds).
previous
1
next
Item hits:
Issue Date
Title
Author(s)
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2003-09
The Impact of Channel Engineering on the Performance Reliability and Scaling of CHISEL NOR Flash EEPROMs
Rao, V. Ramgopal
Discover
Author
2
Rao, V. Ramgopal
Subject
2
EEE
1
Channel hot electron injection
1
Degradation
1
Design engineering
1
Doping
1
Energy Consumption
1
Integrated circuit reliability
1
Integrated circuit technology
1
Nonvolatile memory
1
Reliability engineering
.
next >
Date issued
2
2003
Has File(s)
2
false