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Issue Date
Title
Author(s)
2005-12
NBTI degradation and its impact for analog circuit reliability
Rao, V. Ramgopal
2009-05
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
Rao, V. Ramgopal
2005-09
A new oxide trap-assisted NBTI degradation model
Rao, V. Ramgopal
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Author
3
Rao, V. Ramgopal
Subject
3
EEE
1
Analog/mixed-signal circuits
1
Circuit lifetime
1
Germanium (Ge)
1
Hot carrier (HC)
1
Hydrogen diffusion
1
Impact ionization
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Interface trap generation
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Oxide trap
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pMOSFET
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Date issued
2
2005
1
2009
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3
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