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Issue Date
Title
Author(s)
2009-06
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Rao, V. Ramgopal
2005-09
A new oxide trap-assisted NBTI degradation model
Rao, V. Ramgopal
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Author
2
Rao, V. Ramgopal
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2
EEE
1
Ge pMOSFET
1
Hydrogen diffusion
1
Interface trap
1
Interface trap generation
1
Negative bias temperature instabi...
Date issued
1
2005
1
2009
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