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Issue Date
Title
Author(s)
2011-04
Insights Into the Design and Optimization of Tunnel-FET Devices and Circuits
Rao, V. Ramgopal
2009
A new physical insight and 3D device modeling of STI type denmos device failure under ESD conditions
Rao, V. Ramgopal
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
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Rao, V. Ramgopal
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EEE
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Capacitance
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Electrostatic discharge (ESD)
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