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Issue Date
Title
Author(s)
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2009
Highly resistive body STI NDeMOS: An optimized DeMOS device to achieve moving current filaments for robust ESD protection
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
2004-07
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs
Rao, V. Ramgopal
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Author
4
Rao, V. Ramgopal
Subject
3
EEE
2
Degradation
2
Interface states
2
MOSFETs
1
Breakdown voltage
1
Charge pumps
1
Dielectrics
1
Electric breakdown
1
Electrostatic discharges
1
Los Angeles Council
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Date issued
1
2000
1
2003
1
2004
1
2009
Has File(s)
4
false