Collection's Items (Sorted by Submit Date in Descending order): 441 to 460 of 2012
| Issue Date | Title | Author(s) |
| 2016 | Comparative analysis of performance improvement of MPA by using EBG and DGS structures | Rano, Dinesh |
| 2019 | Determination of Effective Dielectric Constant and Resonant Frequency of Microstrip Patch Antenna with Multilayered Superstrate Structures | Rano, Dinesh |
| 2020-07 | Enhancing the performance of defected ground structure type near-field radiofrequency WPT system by coupled-line impedance matching | Rano, Dinesh |
| 2018 | Interdigital Based EBG: Compact and Polarization Stable for MBAN and Wi-Fi | Rano, Dinesh |
| 2021-05 | Measurements and Characterization of a Newly Developed Novel Miniature WIPT System | Rano, Dinesh |
| 2019 | A Novel Dual Band Defected Ground Structure for Short Range Wireless Power Transfer Applications | Rano, Dinesh |
| 2018 | A High Q Dual E-Shaped Defected Ground Structure for Wireless Power Transfer Applications | Rano, Dinesh |
| 2018 | A novel miniaturized band stop filter using fractal type defected ground structure (DGS) | Rano, Dinesh |
| 2020-02 | A New Model to Determine Effective Permittivity and Resonant Frequency of Patch Antenna Covered With Multiple Dielectric Layers | Rano, Dinesh |
| 2016 | Design and analysis of wearable patch antenna array for MBAN applications | Rano, Dinesh |
| 2019-03 | Extremely compact EBG-backed antenna for smartwatch applications in medical body area network | Rano, Dinesh |
| 1992-01 | Radiation Induced Interface State Generation in Nitrided and Reoxidized Nitrided Gate Oxides | Rao, V. Ramgopal |
| 1997-12 | Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs | Rao, V. Ramgopal |
| 1997-10 | The Planar-Doped-Barrier FET:MOSFET Overcomes Conventional Limitations | Rao, V. Ramgopal |
| 1998-10 | Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technology | Rao, V. Ramgopal |
| 1998-09 | A Study of the Effect of Plasma Etch Damage on Sub-Micron MOSFET's Flicker Noise Properties | Rao, V. Ramgopal |
| 1998 | Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs | Rao, V. Ramgopal |
| 1999-09 | Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics | Rao, V. Ramgopal |
| 1999 | Hot-Carrier Induced Interface Degradation in Jet Vapor Deposited SiN MNSFETs as Studied by a Novel Charge Pumping Technique | Rao, V. Ramgopal |
| 1999 | Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS | Rao, V. Ramgopal |
Collection's Items (Sorted by Submit Date in Descending order): 441 to 460 of 2012
