Collection's Items (Sorted by Submit Date in Descending order): 581 to 600 of 2012
| Issue Date | Title | Author(s) |
| 2020-02 | Development of a new polymer (OSTE+) optical waveguide for evanescent wave absorption-based photonic sensors | Rao, V. Ramgopal |
| 2020 | Optimal Approach to Scaling of the NEMS for Low Stand-by CMOS Applications | Rao, V. Ramgopal |
| 2020 | MEMS based polymeric H2 S gas sensor for agricultural applications | Rao, V. Ramgopal |
| 2022-01 | Energy Efficient Lif Neuron Circuit Using Hybrid Cmos-Nems in 65 Nm Cmos Technology | Rao, V. Ramgopal |
| 2022 | Study of Gold nanoparticles binding dynamics on functionalized surface by ATR-evanescent wave absorption method | Rao, V. Ramgopal |
| 2023 | MoS2 based nanomechanical bolometer for combined radiation sensing and the estimation of material properties | Rao, V. Ramgopal |
| 1992-01 | Radiation‐induced interface‐state generation in reoxidized nitrided SiO2 | Rao, V. Ramgopal |
| 1996-09 | Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectrics | Rao, V. Ramgopal |
| 1996-06 | Hysteresis behavior in 85-nm channel length vertical n-MOSFETs grown by MBE | Rao, V. Ramgopal |
| 1997-03 | High-field stressing of LPCVD gate oxides | Rao, V. Ramgopal |
| 1997-03 | Charge trapping behaviour in deposited and grown thin metal-oxide-semiconductor gate dielectrics | Rao, V. Ramgopal |
| 1998-12 | Flicker Noise in GaN/Al Ga N Doped Channel Heterostructure Field Effect Transistors | Rao, V. Ramgopal |
| 1998-11 | Application of charge pumping technique for sub-micron MOSFET characterization | Rao, V. Ramgopal |
| 1998-05 | Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices | Rao, V. Ramgopal |
| 1998-05 | Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs | Rao, V. Ramgopal |
| 1999-09 | A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping | Rao, V. Ramgopal |
| 1999-09 | Low temperature-high pressure grown thin gate dielectrics for MOS applications | Rao, V. Ramgopal |
| 1999-05 | A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs | Rao, V. Ramgopal |
| 1999 | Gate Stack Architecture Analysis and Channel Engineering in Deep Sub-Micron MOSFETs | Rao, V. Ramgopal |
| 1999-07 | The impact of high-/spl kappa/ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs | Rao, V. Ramgopal |
Collection's Items (Sorted by Submit Date in Descending order): 581 to 600 of 2012
