Collection's Items (Sorted by Submit Date in Descending order): 601 to 620 of 2012
| Issue Date | Title | Author(s) |
| 1999-10 | Exploration of Velocity Overshoot in a High-Performance Deep Sub-0.1- m SOI MOSFET with Asymmetric Channel Profile | Rao, V. Ramgopal |
| 2000-04 | Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs | Rao, V. Ramgopal |
| 2000-01 | A Comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique | Rao, V. Ramgopal |
| 2001 | Comparison of Sub-Bandgap Impact Ionization in Sub-100 nm Conventional and Lateral Asymmetrical Channel nMOSFETs | Rao, V. Ramgopal |
| 2001-11 | A simple and direct technique for interface characterization of SOI MOSFETs and its application in hot carrier degradation studies in sub-100 nm JVD MNSFETs | Rao, V. Ramgopal |
| 2001-09 | Low temperature silicon nitride deposited by Cat-CVD for deep sub-micron metal–oxide–semiconductor devices | Rao, V. Ramgopal |
| 2001-07 | Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI–MOSFETs | Rao, V. Ramgopal |
| 2001-07 | Sub-100 nm CMOS circuit performance with high-K gate dielectrics | Rao, V. Ramgopal |
| 2001-10 | A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique | Rao, V. Ramgopal |
| 2001-04 | Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs | Rao, V. Ramgopal |
| 2002 | Status and Trends in Molecular Electronics | Rao, V. Ramgopal |
| 2002-05 | The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performance | Rao, V. Ramgopal |
| 2002-06 | Optimization and realization of sub-100-nm channel length single halo p-MOSFETs | Rao, V. Ramgopal |
| 2001-07 | Analysis of Floating Body Effects in Thin Film Conventional and Single Pocket SOI MOSFETs using the GIDL Current Technique | Rao, V. Ramgopal |
| 2001-07 | Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique | Rao, V. Ramgopal |
| 2002-07 | Ultra-thin silicon nitride by hot wire chemical vapor deposition (HWCVD) for deep sub-micron CMOS technologies | Rao, V. Ramgopal |
| 2003-12 | Impact of lateral asymmetric channel doping on deep submicrometer mixed-signal device and circuit performance | Rao, V. Ramgopal |
| 2003-10 | CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling and technological parameters | Rao, V. Ramgopal |
| 2003-04 | Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies | Rao, V. Ramgopal |
| 2003-04 | A new method to characterize border traps in submicron transistors using hysteresis in the drain current | Rao, V. Ramgopal |
Collection's Items (Sorted by Submit Date in Descending order): 601 to 620 of 2012
