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http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19264| Title: | VLSI for embedded intelligence: |
| Other Titles: | Proceedings of the 27th International Symposium, VDAT 2023 |
| Authors: | Gupta, Anu Chaturvedi, Nitin |
| Keywords: | EEE VLSI testing VLSI design Low-power integrated circuits FPGA-based design Embedded systems Memory design |
| Issue Date: | 2025 |
| Publisher: | Springer |
| Abstract: | This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. |
| URI: | https://link.springer.com/book/10.1007/978-981-97-3756-7 http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19264 |
| Appears in Collections: | Department of Electrical and Electronics Engineering |
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