VLSI for embedded intelligence:

Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19264

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DC Field	Value	Language
dc.contributor.author	Gupta, Anu	-
dc.contributor.author	Chaturvedi, Nitin	-
dc.date.accessioned	2025-08-29T07:00:57Z	-
dc.date.available	2025-08-29T07:00:57Z	-
dc.date.issued	2025	-
dc.identifier.uri	https://link.springer.com/book/10.1007/978-981-97-3756-7	-
dc.identifier.uri	http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19264	-
dc.description.abstract	This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.	en_US
dc.language.iso	en	en_US
dc.publisher	Springer	en_US
dc.subject	EEE	en_US
dc.subject	VLSI testing	en_US
dc.subject	VLSI design	en_US
dc.subject	Low-power integrated circuits	en_US
dc.subject	FPGA-based design	en_US
dc.subject	Embedded systems	en_US
dc.subject	Memory design	en_US
dc.title	VLSI for embedded intelligence:	en_US
dc.title.alternative	Proceedings of the 27th International Symposium, VDAT 2023	en_US
dc.type	Book	en_US
Appears in Collections:	Department of Electrical and Electronics Engineering

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