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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19306
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dc.contributor.authorBitragunta, Sainath-
dc.date.accessioned2025-09-03T06:41:58Z-
dc.date.available2025-09-03T06:41:58Z-
dc.date.issued2025-08-
dc.identifier.urihttps://iopscience.iop.org/article/10.1088/1748-0221/20/08/P08017/meta-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19306-
dc.description.abstractThe discrimination between neutron and gamma radiation pulses is crucial in mixed environment for neutron spectroscopy, particularly in fields such as nuclear science, nuclear safety, environmental monitoring, and radiation imaging. A quantitative measurement is essential to evaluate the discriminatory performance and a generalized yardstick is desirable for all the available methods. This study introduces a semi-supervised machine learning approach utilizing Multi-Layer Perceptron, Convolutional Neural Network, Long Short-Term Memory Network and Transformer encoder-based classifier to perform neutron-gamma pulse discrimination. The proposed model is applied to pulse signals acquired from a liquid scintillator BC501A coupled with a photomultiplier tube R4144, recognized for their high sensitivity and effectiveness in neutron-gamma discrimination tasks. The model's performance is rigorously evaluated against traditional analogue and digital charge comparison discrimination techniques. A generalized method is introduced in terms of figure of merit for equipollent discrimination performance comparison with existing analog and digital-based methods as well as various other machine learning based classification techniques.en_US
dc.language.isoenen_US
dc.publisherIOPen_US
dc.subjectEEEen_US
dc.subjectNeutron-gamma pulse discriminationen_US
dc.subjectSemi-supervised machine learningen_US
dc.subjectDeep learning classifiersen_US
dc.subjectLiquid scintillatoren_US
dc.titleSemi-supervised machine learning technique for neutron-gamma discrimination and generalized approach for figure of meriten_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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