Please use this identifier to cite or link to this item:
http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/4026| Title: | Reliability Studies of Electronic Componements by Accelerated Life Testing |
| Authors: | Jain, Rajendra Prasad |
| Keywords: | Electrical Electronics |
| Issue Date: | 23-Dec-1980 |
| Publisher: | BITS Pilani |
| Description: | Under Supervision: Prof. K.V. Ramanan |
| URI: | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/4026 |
| Appears in Collections: | Department of Electrical and Electronics Engineering |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Reliability studies of electronic components by accelerated life testing.pdf Restricted Access | 119.59 MB | Adobe PDF | View/Open Request a copy |
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