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http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/4026Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jain, Rajendra Prasad | - |
| dc.date.accessioned | 2022-02-07T06:34:38Z | - |
| dc.date.available | 2022-02-07T06:34:38Z | - |
| dc.date.issued | 1980-12-23 | - |
| dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/4026 | - |
| dc.description | Under Supervision: Prof. K.V. Ramanan | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | BITS Pilani | en_US |
| dc.subject | Electrical | en_US |
| dc.subject | Electronics | en_US |
| dc.title | Reliability Studies of Electronic Componements by Accelerated Life Testing | en_US |
| dc.type | Thesis | en_US |
| Appears in Collections: | Department of Electrical and Electronics Engineering | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Reliability studies of electronic components by accelerated life testing.pdf Restricted Access | 119.59 MB | Adobe PDF | View/Open Request a copy |
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