Please use this identifier to cite or link to this item:
http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/4431Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kandpal, Kavindra | - |
| dc.date.accessioned | 2022-04-27T07:00:28Z | - |
| dc.date.available | 2022-04-27T07:00:28Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/4431 | - |
| dc.description | Supervisor: Navneet Gupta | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | BITS, Pilani | en_US |
| dc.subject | Electrical & Electronics Engineering | en_US |
| dc.title | Investigations on Electronic Behavior and Stability Issues of Zinc Oxide based Thin Film Transistors | en_US |
| dc.type | Thesis | en_US |
| Appears in Collections: | Department of Electrical and Electronics Engineering | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 2014phxf0601p-thesis.pdf | Thesis | 4.11 MB | Adobe PDF | View/Open |
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