Please use this identifier to cite or link to this item:
http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/4917Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Maheshwari, Laxmi Kant | - |
| dc.date.accessioned | 2022-05-25T09:36:59Z | - |
| dc.date.available | 2022-05-25T09:36:59Z | - |
| dc.date.issued | 1971 | - |
| dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/4917 | - |
| dc.description | Supervisor: K.V Ramanan | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | BITS, Pilani | en_US |
| dc.subject | Electronics Engineering | en_US |
| dc.title | Effect of base impurity distribution on the figure of merit of transistors | en_US |
| dc.type | Thesis | en_US |
| Appears in Collections: | Department of Electrical and Electronics Engineering | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Thesis_Laxmi Kant.pdf | Thesis | 6.3 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.