DSpace logo

Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/8948
Title: Substrate Selection Framework for Organic Thin-Film Transistor Based on Flexibility and Reliability Issues
Authors: Gupta, Navneet
Keywords: EEE
Flexible substrate
Interval technique for order preference by similarity to ideal solution (TOPSIS)
Multicriteria decision making (MCDM)
Organic thin-film transistor (OTFT)
Issue Date: Apr-2022
Publisher: IEEE
Abstract: Flexibility is an important feature of organic thin-film transistor (OTFT) technology. The need for flexibility adds challenges to the mechanical reliability of the OTFTs. This work focuses on mechanical and thermal failure mechanisms in an OTFT and their relation with the substrate properties. It is observed that four material parameters of the substrate, namely, Young’s modulus, thermal conductivity, coefficient of thermal expansion, and glass transition temperature, are crucial in determining the reliability and flexibility of the OTFT. Further more, using an interval-based technique for order preference by similarity to ideal solution (TOPSIS) technique, five polymer substrates including polycarbonate (PC), polyethylene naphthalate (PEN), polyethylene terephthalate (PET), polyimide (PI), and polyethersulfone (PES) are analyzed. It is concluded that PI is the most suitable substrate material for OTFTs to improve flexibility and reliability.
URI: https://ieeexplore.ieee.org/document/9783172?source=authoralert
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/8948
Appears in Collections:Department of Electrical and Electronics Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.