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dc.contributor.authorGupta, Navneet-
dc.date.accessioned2023-02-03T10:49:34Z-
dc.date.available2023-02-03T10:49:34Z-
dc.date.issued2022-04-
dc.identifier.urihttps://ieeexplore.ieee.org/document/9783172?source=authoralert-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/8948-
dc.description.abstractFlexibility is an important feature of organic thin-film transistor (OTFT) technology. The need for flexibility adds challenges to the mechanical reliability of the OTFTs. This work focuses on mechanical and thermal failure mechanisms in an OTFT and their relation with the substrate properties. It is observed that four material parameters of the substrate, namely, Young’s modulus, thermal conductivity, coefficient of thermal expansion, and glass transition temperature, are crucial in determining the reliability and flexibility of the OTFT. Further more, using an interval-based technique for order preference by similarity to ideal solution (TOPSIS) technique, five polymer substrates including polycarbonate (PC), polyethylene naphthalate (PEN), polyethylene terephthalate (PET), polyimide (PI), and polyethersulfone (PES) are analyzed. It is concluded that PI is the most suitable substrate material for OTFTs to improve flexibility and reliability.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectFlexible substrateen_US
dc.subjectInterval technique for order preference by similarity to ideal solution (TOPSIS)en_US
dc.subjectMulticriteria decision making (MCDM)en_US
dc.subjectOrganic thin-film transistor (OTFT)en_US
dc.titleSubstrate Selection Framework for Organic Thin-Film Transistor Based on Flexibility and Reliability Issuesen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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