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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/8969
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dc.contributor.authorGupta, Navneet-
dc.contributor.authorKandpal, Kavindra-
dc.date.accessioned2023-02-06T04:47:38Z-
dc.date.available2023-02-06T04:47:38Z-
dc.date.issued2019-05-
dc.identifier.urihttps://link.springer.com/article/10.1007/s10825-019-01344-0-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/8969-
dc.description.abstractOxide thin-film transistors (TFTs) and metal–oxide–semiconductor field-effect transistors (MOSFETs) operate via different conduction mechanisms but exhibit similar device characteristics. In this work, a SPICE level 3 model originally defined for MOSFETs is successfully adapted to provide a behavioral model for oxide TFTs. This adapted compact model is applicable to all kinds of oxide TFTs, irrespective of the channel and dielectric material used. To capture the TFT behavior efficiently, the experimental characteristic of an oxide TFT is used to set various SPICE level 3 parameters.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectEEEen_US
dc.subjectSPICE Level-3en_US
dc.subjectThin-film transistors (TFTs)en_US
dc.subjectMOSFETsen_US
dc.titleAdaptation of a compact SPICE level 3 model for oxide thin-film transistorsen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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