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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/8972
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dc.contributor.authorGupta, Navneet-
dc.date.accessioned2023-02-06T06:37:11Z-
dc.date.available2023-02-06T06:37:11Z-
dc.date.issued2018-11-
dc.identifier.urihttps://link.springer.com/chapter/10.1007/978-981-13-2553-3_57-
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/8972-
dc.description.abstractWe explore the electrical properties of graphene–silicon dioxide–p–silicon Schottky junction diode using current–voltage characteristics and impedance analysis. Ideality factor, rectification ratio, and series resistance are extracted from the experimental data. A linear response of series resistance of graphene/SiO2/p-Si Schottky diode is observed with respect to change in forward bias voltage from 0 to 2 V.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectEEEen_US
dc.subjectSchottky diodeen_US
dc.subjectGraphene nanoplatelets (GNP)en_US
dc.subjectImpedance analysisen_US
dc.subjectSiliconen_US
dc.titleAnalysis of Graphene/SiO2/p-Si Schottky Diode by Current–Voltage and Impedance Measurementsen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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