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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/9003
Title: Sensitivity to Over-Etching of Improved V-Shaped Microcantilever 856
Authors: Gupta, Navneet
Keywords: EEE
Over-Etching
Microcantilever
Issue Date: 2012
Publisher: Trans Tech Publications Ltd
Abstract: In this paper we have analyzed the sensitivity to over-etching of our recently proposed improved V-Shaped microcantilever. For V-shaped microcantilever, the final length is very sensitive to over-etching because of the sharp corner at the free end of the cantilever. It has been observed that for different values of over-etching the improved V-shape microcantilever tip is more robust compared to the linear counterpart.
URI: https://www.scientific.net/AMR.403-408.3376
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9003
Appears in Collections:Department of Electrical and Electronics Engineering

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