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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/9108
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dc.contributor.authorGupta, Anu
dc.contributor.authorAsati, Abhijit
dc.date.accessioned2023-02-09T09:28:23Z
dc.date.available2023-02-09T09:28:23Z
dc.date.issued2018
dc.identifier.urihttps://www.tandfonline.com/doi/full/10.1080/00207217.2018.1440437
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9108
dc.description.abstractIn scaled technologies with lower supply voltage, conventional Static Random Access Memory (SRAM) cell suffers from unsuccessful read & write operation due to high off state current in sub-threshold region at nanometre technologies. This work proposes new functional low-power designs of SRAM cells with 7, 8, 9 and 12 transistors which operate at only 0.4V power supply in sub-threshold operation at 45 nm technology. Stability analysis is carried out using static noise margins as well as N-curve cell stability metrics. For performance measurement, read/write access time and leakage power consumption in hold mode are analysed. The comparison with published designs shows that two new proposed designs namely M8T, MPT8T have 30% less leakage power consumption along with 2× read stability, 2× write ability, more than 60% faster read & write operation.en_US
dc.language.isoenen_US
dc.publisherTaylor & Francisen_US
dc.subjectSRAMen_US
dc.subjectEEEen_US
dc.subjectLow poweren_US
dc.subjectSub-thresholden_US
dc.subjectStatic noise marginen_US
dc.subjectVariabilityen_US
dc.titleNovel low-power and stable SRAM cells for sub-threshold operation at 45 nmen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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