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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/9136
Title: Improved Implementation of CRL and SCRL Gates for Ultra Low Power
Authors: Gupta, Anu
Keywords: EEE
Leakage current
Circuits
Frequency
Rails
Logic
Power engineering and energy
Issue Date: 2009
Publisher: IEEE
Abstract: Working with low frequency universal charge recovery logic (CRL) based NAND gate, the leakage current results in gradual charge up of the output node resulting in an incorrect output. A better implementation of the same circuit which increases the output resistance for the leakage current is used to mitigate this drawback in this paper. Also an analysis of the effect of rise time of clock edge on power dissipation of the split charge recovery logic (SCRL) based NAND gates has also been done.
URI: https://ieeexplore.ieee.org/document/5328051
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9136
Appears in Collections:Department of Electrical and Electronics Engineering

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