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http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/9149| Title: | Characterization of Logical Effort for Improved Delay |
| Authors: | Gupta, Anu |
| Keywords: | EEE Characterization CMOS technology Delay Logical effort Skewed gate |
| Issue Date: | 2013 |
| Publisher: | Springer |
| Abstract: | In this paper, an effort has been made to improve the delay of a gate by skewing the gates by choosing proper sizing. The expression for skewed logical effort has been derived for universal logic gates namely NOT, NAND and NOR for minimizing the delay. The validations for minimum delay through simulation was done on a chain of inverters. The improved skewed gates showed 10% - 20% delay reduction on a chain of inverters as compared with normal skewed gate, high and low skewed gates, whereas, an improvement of 20% - 25% when compared to skewed gates favoring a particular transition. All simulations are done using Spectre in Cadence environment in UMC90nm CMOS technology at 1V power supply. |
| URI: | https://link.springer.com/chapter/10.1007/978-3-642-42024-5_14 http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9149 |
| Appears in Collections: | Department of Electrical and Electronics Engineering |
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