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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/9160
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dc.contributor.authorGupta, Anu
dc.contributor.authorAsati, Abhijit
dc.date.accessioned2023-02-10T10:55:21Z
dc.date.available2023-02-10T10:55:21Z
dc.date.issued2015
dc.identifier.urihttps://ieeexplore.ieee.org/document/7412191
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9160
dc.description.abstractIris segmentation is an important step in iris biometrics and becomes more challenging when iris images are noisy. Iris segmentation process localizes iris in the iris image and detects eyelids also. The proposed method localizes iris in noisy frontal view iris images captured under near infrared (NIR) illumination and having noise issues such as lighting and specular reflections, eyeglasses, low contrast, non-uniform illuminations and occlusions by heavy eyebrows, eyelids, eyelashes and hair. The proposed method is based on circular Hough transform (CHT) and an integro-differential operator (IDO) derived by taking motivation from Daugman's IDO. The pupil is localized using image binarization followed by CHT based algorithm and iris's outer boundary is detected by searching a limited image domain for maximum gray difference between iris and sclera using the proposed IDO. The method was tested on noisy images from two public NIR iris databases: MMU V2.0 and CASIA-Iris-Thousand V4.0. The average accuracy of the proposed method is 99.05 % and average time cost per image is 415 ms. Comparison of results of the proposed method with some published state-of-art iris localization methods proves its novelty.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectIris segmentationen_US
dc.subjectIris localizationen_US
dc.subjectCircular Hough Transform (CHT)en_US
dc.subjectIntegro-differential operatoren_US
dc.subjectIris biometricsen_US
dc.subjectiris recognitionen_US
dc.titleAn Iris localization method for noisy infrared iris imagesen_US
dc.typeArticleen_US
Appears in Collections:Department of Electrical and Electronics Engineering

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