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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bansal, Hari Om | - |
dc.date.accessioned | 2023-02-14T09:54:50Z | - |
dc.date.available | 2023-02-14T09:54:50Z | - |
dc.date.issued | 2009-10 | - |
dc.identifier.uri | https://papers.ssrn.com/sol3/papers.cfm?abstract_id=1490944 | - |
dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9223 | - |
dc.description.abstract | A Support Vector Machine (SVM) is a new supervised machine learning method based on the statistical learning theory. It is a very useful method for classification and regression in small-sample cases such as critical clearing time (TCC) calculations, fault diagnosis, etc. In this paper, an effort has been made to determine the TCC using SVM for a system having exposed to a fault and the results obtained are compared with the results of ‘Step-by-Step’ method - a classical method for determining TCC - to prove its superiority over classical methods | en_US |
dc.language.iso | en | en_US |
dc.publisher | SSRN | en_US |
dc.subject | EEE | en_US |
dc.subject | Clearing time | en_US |
dc.subject | Support Vector Machine (SVM) | en_US |
dc.subject | Transient stability analysis | en_US |
dc.subject | Dynamic Security Assessment (DSA) | en_US |
dc.title | Determination of Critical Clearing Time in a Power System Using Support Vector Machine | en_US |
dc.type | Article | en_US |
Appears in Collections: | Department of Electrical and Electronics Engineering |
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